Test, Measurement & Analytics

Top Stories

AI Models Transform Defect Inspection And Review, But Can...
Majority of AI initiatives falter; synthetic data gaining traction due to limited real-world data.
Published on June 9th, 2026 by Laura Peters

Why Analog And Mixed-Signal Chips Resist Adaptive Test
Analog behavior is difficult to compress into simple pass/fail decisions that could reduce redundant coverage.
Published on June 9th, 2026 by Gregory Haley

Co-Packaged Optics Testing Faces Steep Data Center Ramp
Scaling to tens of millions of CPO units per year requires the industry to first settle on automated, cost-effective methods for electrical and opt...
Published on June 9th, 2026 by Anne Meixner

AI Accelerator Testing Depends On DFT Innovations
Multi-die assemblies greatly increase the number of things that can go wrong, and the difficulty of finding them.
Published on May 12th, 2026 by Laura Peters

Smart Test Collides With The Data Chain
Increasing complexity is limiting the ability of machine learning models to effectively utilize test data.
Published on May 12th, 2026 by Gregory Haley

HBM Shifts Testing Left To Preserve AI Chip Yield
Testing sooner and more often can improve quality and reduce scrap, but it's also more costly.
Published on May 12th, 2026 by Anne Meixner

What’s Failing At The Interface
In advanced packages, the interface is where problems show up, but rarely where they begin.
Published on April 7th, 2026 by Gregory Haley

AI Accelerators Usher In New Era For IC Test
The number and variety of test interfaces, coupled with increased packaging complexity, are adding a slew of new challenges.
Published on April 7th, 2026 by Laura Peters

Untrusted Analog Components Add Risks For Critical Infras...
A certificate-based, tamper-proof system can stifle growing grey-market and counterfeit problems. But it requires investment and a lot more coordin...
Published on April 7th, 2026 by Anne Meixner

Detecting Chemical Variability At Advanced Nodes
Yield loss is increasingly molecular in origin and invisible to conventional inspection.
Published on March 10th, 2026 by Gregory Haley

More Top Stories »



Round Tables

Who Is Most Likely To Link Financial And Manufacturing Data?
Who is most affected by linking of financial data and why.
Published on May 8th, 2025 by Anne Meixner

Secure Handling Of Financial Data In Manufacturing
Data sharing becomes more challenging when AI and multi-die assemblies are involved.
Published on April 21st, 2025 by Anne Meixner

Chip Failures: Prevention And Responses Over Time
How to identify the causes of failures before they happen, and how latent defects and rising complexity can impact reliability and security after y...
Published on March 19th, 2025 by Ed Sperling

Optimizing DFT With AI And BiST
AI-driven automation, tighter design-test collaboration, and evolving BiST techniques are redefining DFT strategies.
Published on February 12th, 2025 by Gregory Haley

DFT At The Leading Edge
Rising complexity and heterogeneous integration are reshaping test methodologies and fault coverage, but challenges persist.
Published on January 14th, 2025 by Gregory Haley

More Roundtables »



Multimedia

Will Your Chip’s Memory Work As Expected?
How to ensure that memory is fully tested and repaired.
Published on June 22nd, 2026 by Ed Sperling

Moving Defect Detection And Classification To The Edge
Explosion in defectivity requires much faster determination of critical and non-critical defects.
Published on May 29th, 2026 by Ed Sperling

System-in-Package Challenges
Engineering considerations in multi-chiplet designs.
Published on April 23rd, 2026 by Ed Sperling

Improving Yield Through Shared Data
The case for sharing test, manufacturing, and design data.
Published on March 11th, 2026 by Ed Sperling

DFT Shifts Further Left
How multi-die assemblies are changing design for test.
Published on December 8th, 2025 by Ed Sperling

More Multimedia »



See All Posts in Test, Measurement and Analytics »

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